The links below explain how our advanced technology will help you rapidly improve the quality of your application, reduce development and testing costs by identify problems far more quickly than conventional tools or techniques.
› Derived Model Analysis: Detecting J2EE problems before they happen
This white paper describes the patent pending modelling techniques used in eoSense and shows how the eoSense Derived Model is used in problem detection.
› Detecting Java EE Problems with eoSense
This white paper works thourgh practical examples of Java EE problem vizualization, detection and resolution.
› Detecting Problems in Spring Applications
This white paper explains how eoSense can validate and visualize applications built with the Spring Framework.
› Case Study: Using eoSense to Visualize J2EE Performance
This case study shows how eoSense was used to solve a critical performance problem at the Department of Revenue in Minnesota.